Issue Details
When running tests using the PXIe-4309 with the TestStand Semiconductor Module (TSM), I observe an increase in execution time when switching from single-site to multisite operation.
For example, single-site execution completes faster, but when enabling multiple sites, the execution time increases noticeably.
In my pin map, I am using the following NI-DAQmx task that includes channels from multiple PXI modules:
<NIDAQmxTask name="DAQforSite0and2" taskType="AI" channelList="DAQ_4309_C1_S02/ai20,DAQ_4309_C1_S02/ai28,
DAQ_4309_C1_S05/ai20,DAQ_4309_C1_S05/ai28" />
I consistently observe longer execution time when running multisite tests compared to single-site tests.