Typ and Max Gain and Offset Error in Accuracy Specifications

Updated May 3, 2018

Reported In


  • PXIe-4330


  • NI-DAQmx

Issue Details

I have a PXIe-4330 for which I am looking at the accuracy in the device specifications, but I have a couple of questions about gain and offset error. 
  • What exactly does the “TYP” and “MAX” attribution on the error info sheet mean?
  • Does this relate to the statistical distribution of each, like 1-sigma for the TYP but 3-sigma for max?
  • Do these errors follow a standard statistical distribution? 


  • TYP will refer to the typical error spec for the majority of instruments within the recommended calibration cycle for the device. As one may expect with the term "typical," these values are not warranted or guaranteed, but are typical as seen in verification & validation (V&V) testing for normal use. 
  • MAX will refer to the maximum error for the worst case still within the device's specified temperature range of use. 
  • During V&V testing in the manufacturing process, we primarily spec to the TYP error for typical use and the worst case still within recommended range for MAX error; however, we do not explicitly test those to translate to sigma values or to follow a specific statistical distribution. 

Additional Information

More information on specifications, accuracy, and error are explained in further detail in the white paper Specifications Explained: NI Multifunction I/O (MIO) DAQ


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