Externally Verify Reading and Writing Values of a Multifunction DAQ

Updated Jan 20, 2023

Environment

Hardware

  • Multifunction I/O Device
  • PXI Multifunction I/O Module
  • C Series Multifunction I/O Module

Software

  • Measurement & Automation Explorer (MAX)
  • LabVIEW

Driver

  • NI-DAQmx

How can I verify my multifunction DAQ card is reading or writing the correct value?

An external loopback test will verify with a known source whether an output or input channel is working properly.  Follow the steps below to perform an external loopback test.
  1. Wire AI x to AO y.  The device pinouts can be found in Measurement & Automation Explorer (MAX) by right-clicking the device, as shown in figure below.
 
  1.  Open Cont Acq&Graph Voltage-Int Clk. vi from NI Example Finder, as shown in figure below. In LabVIEW select Help»Find Examples. From the NI Example Finder window, select Hardware Input and Output»DAQmx»Analog Measurements»Voltage»Cont Acq&Graph Voltage-Int Clk. vi. This example will read the analog input channel.
 
  1. Open a test panel in MAX. A test panel can be opened by right-clicking the device or selecting Test Panels from the toolbar, as shown in figure below.
 
  1. Configure the test panel for the analog output channel, as shown in figure below. Select Run to generate a signal from AO y.
 
  1. Run the Cont Acq&Graph Voltage-Int Clk. vi and verify the signal appears as expected, as in figure below.


 

Related Links

E Series, M Series, and X Series Internal Loopback Test

Other Support Options

Ask the NI Community

Collaborate with other users in our discussion forums



Request Support from an Engineer

A valid service agreement may be required, and support options vary by country.